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Category: JEDEC

Showing 46–60 of 419 results

  • Sale! JEDEC JEP145

    JEDEC JEP145

     $31.80

    GUIDELINE FOR ASSESSING THE CURRENT-CARRYING CAPABILITY OF THE LEADS IN A POWER PACKAGE SYSTEM

    Published by Publication Date Number of Pages
    JEDEC 02/01/2003 11
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  • Sale! JEDEC JEP146A

    JEDEC JEP146A

     $36.00

    GUIDELINES FOR SUPPLIER PERFORMANCE RATING

    Published by Publication Date Number of Pages
    JEDEC 01/01/2009 20
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  • Sale! JEDEC JEP147

    JEDEC JEP147

     $31.80

    PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)

    Published by Publication Date Number of Pages
    JEDEC 10/01/2003 11
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  • Sale! JEDEC JEP148B

    JEDEC JEP148B

     $46.80

    RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT

    Published by Publication Date Number of Pages
    JEDEC 01/01/2014 38
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  • Sale! JEDEC JEP149

    JEDEC JEP149

     $35.40

    APPLICATION THERMAL DERATING METHODOLOGIES

    Published by Publication Date Number of Pages
    JEDEC 11/01/2004 17
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  • Sale! JEDEC JEP150.01

    JEDEC JEP150.01

     $40.20

    STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS

    Published by Publication Date Number of Pages
    JEDEC 06/01/2013 24
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  • Sale! JEDEC JEP151

    JEDEC JEP151

     $37.20

    , Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices

    Published by Publication Date Number of Pages
    JEDEC 12/01/2015 24
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  • Sale! JEDEC JEP152

    JEDEC JEP152

     $43.20

    DDR2 DIMM CLOCK SKEW MEASUREMENT PROCEDURE USING A CLOCK REFERENCE BOARD

    Published by Publication Date Number of Pages
    JEDEC 05/01/2007 29
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  • Sale! JEDEC JEP153A

    JEDEC JEP153A

     $36.00

    CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES

    Published by Publication Date Number of Pages
    JEDEC 03/01/2014 20
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  • Sale! JEDEC JEP154

    JEDEC JEP154

     $45.60

    GUIDELINE FOR CHARACTERIZING SOLDER BUMP ELECTROMIGRATION UNDER CONSTANT CURRENT AND TEMPERATURE STRESS

    Published by Publication Date Number of Pages
    JEDEC 01/01/2008 34
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  • Sale! JEDEC JEP155B

    JEDEC JEP155B

     $54.60

    RECOMMENDED ESD TARGET LEVELS FOR HBM QUALIFICATION

    Published by Publication Date Number of Pages
    JEDEC 07/01/2018 58
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  • Sale! JEDEC JEP156A

    JEDEC JEP156A

     $40.20

    CHIP-PACKAGE INTERACTION UNDERSTANDING, IDENTIFICATION AND EVALUATION

    Published by Publication Date Number of Pages
    JEDEC 03/01/2018 24
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  • Sale! JEDEC JEP157A

    JEDEC JEP157A

     $124.80

    Recommended ESD-CDM Target Levels

    Published by Publication Date Number of Pages
    JEDEC 04/01/2022 174
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  • Sale! JEDEC JEP158

    JEDEC JEP158

     $37.20

    3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions

    Published by Publication Date Number of Pages
    JEDEC 11/01/2009 23
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  • Sale! JEDEC JEP159A

    JEDEC JEP159A

     $44.40

    PROCEDURE FOR THE EVQLUQTION OF LOW-k/METAL INTER/INTRA-LEVEL DIELECTRIC INTEGRITY

    Published by Publication Date Number of Pages
    JEDEC 07/01/2015 30
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