Category: JEDEC

Showing 16–30 of 419 results

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  JEDEC JEP001-2A

  $78.00 $46.80

  FOUNDRY PROCESS QUALIFICATION GUIDELINES – FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2018	36

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  JEDEC JEP001-3A

  $72.00 $43.20

  FOUNDRY PROCESS QUALIFICATION GUIDELINES – PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2018	27

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  JEDEC JEP103A (R2003)

  $48.00 $28.80

  SUGGESTED PRODUCT-DOCUMENTATION, CLASSIFICATIONS, AND DISCLAIMERS

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/1996	7

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  JEDEC JEP104C.01

  $116.00 $69.60

  REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES

  Published by	Publication Date	Number of Pages
  JEDEC	05/01/2003	76

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  JEDEC JEP106AM

  $69.00 $41.40

  STANDARD MANUFACTURER'S IDENTIFICATION CODE

  Published by	Publication Date	Number of Pages
  JEDEC	01/01/2014	33

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  JEDEC JEP110

  $54.00 $32.40

  GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/1988	13

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  JEDEC JEP114.01

  $78.00 $46.80

  GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2007	37

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  JEDEC JEP115 (R1999)

  $53.00 $31.80

  POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/1989	11

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  JEDEC JEP116

  $141.00 $84.60

  CMOS SEMICUSTOM DESIGN GUIDELINES

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1991	86

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  JEDEC JEP118

  $72.00 $43.20

  GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/2018	28

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  JEDEC JEP119A

  $74.00 $44.40

  A PROCEDURE FOR EXECUTING SWEAT

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/2003	32

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  JEDEC JEP120-A

  $141.00 $84.60

  INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS

  Published by	Publication Date	Number of Pages
  JEDEC	05/01/2000	96

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  JEDEC JEP121A

  $76.00 $45.60

  REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2006	35

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  JEDEC JEP122H

  $123.88 $74.33

  Failure Mechanisms and Models for Semiconductor Devices

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2016	114

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  JEDEC JEP123

  $62.00 $37.20

  GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/1995	23

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