JEDEC

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  FOUNDRY PROCESS QUALIFICATION GUIDELINES - FRONT END TRANSISTOR LEVEL (Wafer Fabrication Manufacturing Sites)

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2018	36

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  JEDEC JEP001-2A

  $78.00 Original price was: $78.00.$46.80Current price is: $46.80.

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  FOUNDRY PROCESS QUALIFICATION GUIDELINES - PRODUCT LEVEL (Wafer Fabrication Manufacturing Sites)

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2018	27

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  JEDEC JEP001-3A

  $72.00 Original price was: $72.00.$43.20Current price is: $43.20.

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  SUGGESTED PRODUCT-DOCUMENTATION, CLASSIFICATIONS, AND DISCLAIMERS

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/1996	7

  JEDEC JEP103A (R2003)

  $48.00 Original price was: $48.00.$28.80Current price is: $28.80.

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  REFERENCE GUIDE TO LETTER SYMBOLS FOR SEMICONDUCTOR DEVICES

  Published by	Publication Date	Number of Pages
  JEDEC	05/01/2003	76

  JEDEC JEP104C.01

  $116.00 Original price was: $116.00.$69.60Current price is: $69.60.

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  STANDARD MANUFACTURER'S IDENTIFICATION CODE

  Published by	Publication Date	Number of Pages
  JEDEC	01/01/2014	33

  JEDEC JEP106AM

  $69.00 Original price was: $69.00.$41.40Current price is: $41.40.

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  GUIDELINES FOR THE MEASUREMENT OF THERMAL RESISTANCE OF GaAs FETS

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/1988	13

  JEDEC JEP110

  $54.00 Original price was: $54.00.$32.40Current price is: $32.40.

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  GUIDELINES FOR PARTICLE IMPACT NOISE DETECTION (PIND) TESTING, OPERATOR TRAINING, AND CERTIFICATION

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2007	37

  JEDEC JEP114.01

  $78.00 Original price was: $78.00.$46.80Current price is: $46.80.

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  POWER MOSFET ELECTRICAL DOSE RATE TEST METHOD

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/1989	11

  JEDEC JEP115 (R1999)

  $53.00 Original price was: $53.00.$31.80Current price is: $31.80.

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  CMOS SEMICUSTOM DESIGN GUIDELINES

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/1991	86

  JEDEC JEP116

  $141.00 Original price was: $141.00.$84.60Current price is: $84.60.

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  GUIDELINES FOR GaAs MMIC AND FET LIFE TESTING

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/2018	28

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  JEDEC JEP118

  $72.00 Original price was: $72.00.$43.20Current price is: $43.20.

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  A PROCEDURE FOR EXECUTING SWEAT

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/2003	32

  JEDEC JEP119A

  $74.00 Original price was: $74.00.$44.40Current price is: $44.40.

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  INDEX OF TERMS DEFINED IN JEDEC PUBLICATIONS

  Published by	Publication Date	Number of Pages
  JEDEC	05/01/2000	96

  JEDEC JEP120-A

  $141.00 Original price was: $141.00.$84.60Current price is: $84.60.

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  REQUIREMENTS FOR MICROELECTRONIC SCREENING AND TEST OPTIMIZATION

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2006	35

  JEDEC JEP121A

  $76.00 Original price was: $76.00.$45.60Current price is: $45.60.

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  Failure Mechanisms and Models for Semiconductor Devices

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2016	114

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  JEDEC JEP122H

  $123.88 Original price was: $123.88.$74.33Current price is: $74.33.

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  GUIDELINE FOR MEASUREMENT OF ELECTRONIC PACKAGE INDUCTANCE AND CAPACITANCE MODEL PARAMETERS

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/1995	23

  JEDEC JEP123

  $62.00 Original price was: $62.00.$37.20Current price is: $37.20.

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