Category: JEDEC

Showing 391–405 of 419 results

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  JEDEC JESD84-B50

  $305.00 $183.00

  Embedded Multi-media card (e*MMC), Electrical Standard 5.0

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2013	296

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  JEDEC JESD84-B51

  $327.00 $196.20

  Embedded Multi-media card (e*MMC), Electrical Standard (5.1)

  Published by	Publication Date	Number of Pages
  JEDEC	02/01/2015	352

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  JEDEC JESD84-C43

  $54.00 $32.40

  EMBEDDED MULTIMEDIACARD (e*MMC)MECHANICAL STANDARD

  Published by	Publication Date	Number of Pages
  JEDEC	12/01/2007	14

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  JEDEC JESD85

  $72.00 $43.20

  METHODS FOR CALCULATING FAILURE RATES IN UNITS OF FITS

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/2001	27

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  JEDEC JESD86A

  $53.00 $31.80

  ELECTRICAL PARAMETERS ASSESSMENT

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2009	27

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  JEDEC JESD87

  $54.00 $32.40

  STANDARD TEST STRUCTURE FOR RELIABILITY ASSESSMENT OF AlCu METALLIZATIONS WITH BARRIER MATERIALS

  Published by	Publication Date	Number of Pages
  JEDEC	07/01/2001	14

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  JEDEC JESD88E

  $150.00 $90.00

  JEDEC Dictionary of Terms for Solid-State Technology, Sixth Edition

  Published by	Publication Date	Number of Pages
  JEDEC	06/01/2013	274

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  JEDEC JESD89-1A

  $56.00 $33.60

  TEST METHOD FOR REAL-TIME SOFT ERROR RATE

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2007	15

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  JEDEC JESD89-2A

  $60.00 $36.00

  TEST METHOD FOR ALPHA SOURCE ACCELERATED SOFT ERROR RATE

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2007	19

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  JEDEC JESD89-3A

  $72.00 $43.20

  TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/2007	27

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  JEDEC JESD89A

  $141.00 $84.60

  MEASUREMENT AND REPORTING OF ALPHA PARTICLE AND TERRESTRIAL COSMIC RAY INDUCED SOFT ERRORS IN SEMICONDUCTOR DEVICES

  Published by	Publication Date	Number of Pages
  JEDEC	10/01/2006	0

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  JEDEC JESD8C.01

  $56.00 $33.60

  INTERFACE STANDARD FOR NOMINAL 3.0 V/3.3 V SUPPLY DIGITAL INTEGRATED CIRCUITS

  Published by	Publication Date	Number of Pages
  JEDEC	09/01/2007	15

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  JEDEC JESD90

  $60.00 $36.00

  A PROCEDURE FOR MEASURING P-CHANNEL MOSFET NEGATIVE BIAS TEMPERATURE INSTABILITIES

  Published by	Publication Date	Number of Pages
  JEDEC	11/01/2004	19

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  JEDEC JESD91B

  $60.00 $36.00

  Method for Developing Acceleration Models for Electronic Device Failure Mechanisms

  Published by	Publication Date	Number of Pages
  JEDEC	03/01/2022	20

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  JEDEC JESD92

  $74.00 $44.40

  PROCEDURE FOR CHARACTERIZING TIME-DEPENDENT DIELECTRIC BREAKDOWN OF ULTRA-THIN GATE DIELECTRICS

  Published by	Publication Date	Number of Pages
  JEDEC	08/01/2003	32

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