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JEDEC JESD91B

JEDEC JESD91B

$36.00

Method for Developing Acceleration Models for Electronic Device Failure Mechanisms

Published by Publication Date Number of Pages
JEDEC 03/01/2022 20
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JEDEC JESD91B – Method for Developing Acceleration Models for Electronic Device Failure Mechanisms

The method described in this document applies to all reliability mechanisms associated with electronic devices.

The purpose of this standard is to provide a reference for developing acceleration models for defect-related and wear-out mechanisms in electronic devices.

Product Details

Published:
03/01/2022
Number of Pages:
20
File Size:
1 file , 370 KB
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