Category: JEDEC
JEDEC
Showing 1–15 of 419 results
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JEDEC EIA 318-B
$35.40Add to cartMEASUREMENT OF REVERSE RECOVERY TIME FOR SEMICONDUCTOR SIGNAL DIODES
Published by Publication Date Number of Pages JEDEC 07/01/1996 18 -
JEDEC EIA 323 (R2002)
$30.60Add to cartAIR-CONVECTION-COOLED, LIFE TEST ENVIRONMENT FOR LEAD-MOUNTED SEMICONDUCTOR DEVICES
Published by Publication Date Number of Pages JEDEC 03/01/1966 9 -
JEDEC EIA 365 (R1984)
$35.40Add to cartPERFORMANCE TEST PROCEDURE FOR SOLAR CELLS AND CALIBRATION PROCEDURE FOR SOLAR CELL STANDARDS FOR SPACE VEHICLE SERVICE
Published by Publication Date Number of Pages JEDEC 11/01/1969 18 -
JEDEC EIA 397
$136.80Add to cartRECOMMENDED STANDARD FOR THYRISTORS
Published by Publication Date Number of Pages JEDEC 06/01/1972 192 -
JEDEC J-STD-020E
$45.00Add to cartJOINT IPC/JEDEC STANDARD FOR MOISTURE/REFLOW SENSITIVITY CLASSIFICATION FOR NONHERMETIC SOLID STATE SURFACE-MOUNT DEVICES
Published by Publication Date Number of Pages JEDEC 12/01/2014 24 -
JEDEC J-STD-033D
$53.40Add to cartHandling, Packing, Shipping, and Use of Moisture/Reflow Sensitive Surface-Mount Devices
Published by Publication Date Number of Pages JEDEC 04/01/2018 31 -
JEDEC J-STD-033D
$47.40Add to cartHandling, Packing, Shipping and Use of Moisture, Reflow, and Process Sensitive Devices
Published by Publication Date Number of Pages JEDEC 04/01/2018 31 -
JEDEC J-STD-035
$21.00Add to cartJOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
Published by Publication Date Number of Pages JEDEC 05/01/1999 0 -
JEDEC J-STD-048
$30.60Add to cartNotification Standard for Product Discontinuance
Published by Publication Date Number of Pages JEDEC 11/01/2014 10 -
JEDEC J-STD-609B
$37.20Add to cartMARKING, SYMBOLS, AND LABELS OF LEADED AND LEAD-FREE TERMINAL FINISHED MATERIALS USED IN ELECTRONIC ASSEMBLY
Published by Publication Date Number of Pages JEDEC 04/01/2016 24 -
JEDEC JEB 15
$84.60Add to cartTERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
Published by Publication Date Number of Pages JEDEC 11/01/1969 97 -
JEDEC JEB 19
$30.60Add to cartRECOMMENDED CHARACTERIZATION OF MOS SHIFT REGISTERS
Published by Publication Date Number of Pages JEDEC 11/01/1972 10 -
JEDEC JEB 5-A (R1984)
$48.00Add to cartMETHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
Published by Publication Date Number of Pages JEDEC 01/01/1970 44 -
JEDEC JEP 79
$40.20Add to cartLIFE TEST METHODS FOR PHOTOCONDUCTIVE CELLS
Published by Publication Date Number of Pages JEDEC 09/01/1969 25 -
JEDEC JEP001-1A
$40.20Add to cartFOUNDRY PROCESS QUALIFICATION GUIDELINES – BACKEND OF LINE (Wafer Fabrication Manufacturing Sites)
Published by Publication Date Number of Pages JEDEC 09/01/2018 26
