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PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)
Published by | Publication Date | Number of Pages |
JEDEC | 10/01/2003 | 11 |
JEDEC JEP147 – PROCEDURE FOR MEASURING INPUT CAPACITANCE USING A VECTOR NETWORK ANALYZER (VNA)
This procedure describes a recommended way to measure pin capacitance of devices with SSTL (Stub Series Terminated Logic) interface pins by use of a Vector Network Analyzer. One purpose of this standard procedure is to reduce the lengthy and often inaccurate footnote – usually found around the specification of pin parasitics – to a simple reference to this document. In special cases modifying statements may adjust this procedure to the special needs of certain component.
Product Details
- Published:
- 10/01/2003
- Number of Pages:
- 11
- File Size:
- 1 file , 260 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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