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JEDEC JEP148B
$46.80
RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
| Published by | Publication Date | Number of Pages |
| JEDEC | 01/01/2014 | 38 |
JEDEC JEP148B – RELIABILITY QUALIFICATION OF SEMICONDUCTOR DEVICES BASED ON PHYSICS OF FAILURE RISK AND OPPORTUNITY ASSESSMENT
A concept is outlined, which proactively integrates qualification into the development process and provides a systematic procedure as support tool to development and gives early focus on required activities. It converts requirements for a product into measures of development and qualification in combination with a risk and opportunity assessment step and accompanies the development process as guiding and recording tool for advanced quality planning and confirmation. The collected data enlarge the knowledge database for DFR / BIR (design for reliability / building-in reliability) to be used for future projects. The procedure challenges and promotes teamwork of all involved disciplines.
Product Details
- Published:
- 01/01/2014
- Number of Pages:
- 38
- File Size:
- 1 file , 290 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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