Category
JEDEC JEP133C
$78.00 $46.80
GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
Published by | Publication Date | Number of Pages |
JEDEC | 01/01/2010 | 37 |
JEDEC JEP133C – GUIDE FOR THE PRODUCTION AND ACQUISITION OF RADIATION-HARDNESS ASSURED MULTICHIP MODULES AND HYBRID MICROCIRCUITS
A revised and expanded publication for suppliers and users of radiation hardness assured (RHA) multichip modules (MCMs) and hybrid microcircuits, is now available. Revision A of JEP133 includes modifications to the introduction, clarification of a definition and clarification of several technical issues within the document. In addition, the Bibliography section was updated to include added references. The document provides guidance as to how to achieve, maintain and ensure required levels of radiation-hardness given the fact that the constituent dice can have different levels of hardness assurance. It also describes how to deal with the various radiation hardness situations that an MCM/Hybrid developer, procuring activity or user will encounter. The guide is intended to supplement three relevant performance specifications: MIL-PRF-38534, MIL-PRF-38535 and MIL-PRF-19500.
Product Details
- Published:
- 01/01/2010
- Number of Pages:
- 37
- File Size:
- 1 file , 200 KB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
Related products
-
JEDEC JS 9703
$87.00$52.20Add to cartIPC/JEDEC-9703: Mechanical Shock Test Guidelines for Solder Joint Reliability
Published by Publication Date Number of Pages JEDEC 03/01/2009 46 -
JEDEC J-STD-035
$35.00$21.00Add to cartJOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
Published by Publication Date Number of Pages JEDEC 05/01/1999 0 -
JEDEC JESD99C
$163.00$97.80Add to cartTerms, Definitions, and Letter Symbols for Microelectronic Devices
Published by Publication Date Number of Pages JEDEC 12/01/2012 120 -
JEDEC JESD91B
$60.00$36.00Add to cartMethod for Developing Acceleration Models for Electronic Device Failure Mechanisms
Published by Publication Date Number of Pages JEDEC 03/01/2022 20