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METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
Published by | Publication Date | Number of Pages |
JEDEC | 01/01/1970 | 44 |
JEDEC JEB 5-A (R1984) – METHODS OF MEASUREMENT FOR SEMICONDUCTOR LOGIC GATING MICROCIRCUITS
The purpose of this bulletin is to recommend for use in the rating of semiconductor logic gating microcircuits which use the binary states to represent and process logic information. Both static and dynamic measurements are covered.
Product Details
- Published:
- 01/01/1970
- Number of Pages:
- 44
- File Size:
- 1 file , 1.4 MB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
Category: JEDEC
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