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JEDEC JEP138

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USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE

Published by Publication Date Number of Pages
JEDEC 09/01/1999 11
Digital PDFMulti-User AccessPrintable

JEDEC JEP138 – USER GUIDELINES FOR IR THERMAL IMAGING DETERMINATION OF DIE TEMPERATURE

The purpose of these user guidelines is to provide background and an example for the use of an infrared (IR) microscope to determine die temperature of electronic devices for calculations such as thermal resistance.

Product Details

Published:
09/01/1999
Number of Pages:
11
File Size:
1 file , 54 KB
Note:
This product is unavailable in Russia, Ukraine, Belarus
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