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× JEDEC JESD14 (R2002) 1 × $35.40
× IEEE 1050 1 × $49.20
× IEEE 1036 1 × $60.60
× JEDEC JESD 353 (R2009) 1 × $30.60

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SOLID STATE DRIVE (SSD) ENDURANCE WORKLOADS
Published by Publication Date Number of Pages
JEDEC 09/01/2010 10
JEDEC JESD 219
Original price was: $51.00.Current price is: $30.60.
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MEASURING WHISKER GROWTH ON TIN AND TIN ALLOY SURFACE FINISHES
Published by Publication Date Number of Pages
JEDEC 07/01/2008 31
JEDEC JESD 22-A121A (R2014)
Original price was: $74.00.Current price is: $44.40.
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LEAD INTEGRITY
Published by Publication Date Number of Pages
JEDEC 05/01/2003 20
JEDEC JESD 22-B105C (R2006)
Original price was: $60.00.Current price is: $36.00.
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TEST METHODS AND CHARACTER DESIGNATION FOR LIQUID CRYSTAL DEVICES:
Published by Publication Date Number of Pages
JEDEC 05/01/1982 31
JEDEC JESD 23
Original price was: $74.00.Current price is: $44.40.
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COLOR CODING OF DISCRETE SEMICONDUCTOR DEVICES
Published by Publication Date Number of Pages
JEDEC 03/01/1986 10
JEDEC JESD 236-C (R2009)
Original price was: $51.00.Current price is: $30.60.
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POWER MOSFETS
Published by Publication Date Number of Pages
JEDEC 07/01/1985 55
JEDEC JESD 24
Original price was: $91.00.Current price is: $54.60.
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CERAMIC PACKAGE SPECIFICATION FOR MICROELECTRONIC PACKAGES
Published by Publication Date Number of Pages
JEDEC 08/01/1993 50
JEDEC JESD 27
Original price was: $87.00.Current price is: $52.20.
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CONDITIONS FOR MEASUREMENT OF DIODE STATIC PARAMETERS
Published by Publication Date Number of Pages
JEDEC 12/01/1992 5
JEDEC JESD 320-A (R2002)
Original price was: $47.00.Current price is: $28.20.
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NUMBERING OF LIKE-NAMED TERMINAL FUNCTIONS IN SEMICONDUCTOR DEVICES AND DESIGNATION OF UNITS IN MULTIPLE-UNIT SEMICONDUCTOR DEVICES
Published by Publication Date Number of Pages
JEDEC 02/01/1987 12
JEDEC JESD 321-C (R2009)
Original price was: $53.00.Current price is: $31.80.
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ADDENDUM No. 1 to JESD35 - GENERAL GUIDELINES FOR DESIGNING TEST STRUCTURES FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
Published by Publication Date Number of Pages
JEDEC 09/01/1995 26
JEDEC JESD 35-1
Original price was: $67.00.Current price is: $40.20.
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ADDENDUM No. 2 to JESD35 - TEST CRITERIA FOR THE WAFER-LEVEL TESTING OF THIN DIELECTRICS
Published by Publication Date Number of Pages
JEDEC 02/01/1996 13
JEDEC JESD 35-2
Original price was: $54.00.Current price is: $32.40.
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PROCEDURE FOR WAFER-LEVEL-TESTING OF THIN DIELECTRICS
Published by Publication Date Number of Pages
JEDEC 03/01/2010 47
JEDEC JESD 35-A
Original price was: $87.00.Current price is: $52.20.
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THE MEASUREMENT OF TRANSISTOR NOISE FIGURE AT FREQUENCIES UP TO 20 kHz BY SINUSOIDAL SIGNAL-GENERATOR METHOD
Published by Publication Date Number of Pages
JEDEC 04/01/1968 9
JEDEC JESD 353 (R2009)
Original price was: $51.00.Current price is: $30.60.
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THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz
Published by Publication Date Number of Pages
JEDEC 04/01/1968 10
JEDEC JESD 354 (R2009)
Original price was: $51.00.Current price is: $30.60.
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STANDARD DESCRIPTION OF LOW-VOLTAGE TTL-COMPATIBLE, 5 V TOLERANT CMOS LOGIC DEVICES
Published by Publication Date Number of Pages
JEDEC 06/01/1996 15
JEDEC JESD 36
Original price was: $56.00.Current price is: $33.60.
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