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JEDEC JEB 15
$84.60
TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
| Published by | Publication Date | Number of Pages |
| JEDEC | 11/01/1969 | 97 |
JEDEC JEB 15 – TERMINOLOGY AND METHODS OF MEASUREMENT FOR BISTABLE SEMICONDUCTOR MICROCIRCUITS
This bulletin explains the terminology and methods of measurement for bistable semiconductor microcircuits. It is also intended to be used with the EIA Registration Data Format for semiconductor integrated bistable logic circuits.
Product Details
- Published:
- 11/01/1969
- Number of Pages:
- 97
- File Size:
- 1 file
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
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