Description

MIL MIL-STD-750-3 – DEPARTMENT OF DEFENSE TEST METHOD STANDARD TRANSISTOR ELECTRICAL TEST METHODS FOR SEMICONDUCTOR DEVICES PART 3: TEST METHODS 3000 THROUGH 3999

Part 3 of this test method standard MIL-STD-750-3 establishes uniform test methods for the electrical testing of semiconductor transistors to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Product Details

Published:

01/03/2012

Number of Pages:

345

File Size:

1 file , 3.1 MB

Note:

This product is unavailable in Ukraine, Russia, Belarus