Description

Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Product Details

Published:

08/12/2016

Number of Pages:

177

File Size:

1 file , 1.5 MB

Note:

This product is unavailable in Ukraine, Russia, Belarus

Description

MIL MIL-STD-750-1A Change 2 – Environmental Test Methods for Semiconductor Devices Part 1: Test Methods 1000 Through 1999

Revision A Change 2 (all previous changes incorporated)

Part 1 of this test method standard establishes uniform test methods for the basic environmental testing of semiconductor devices to determine resistance to deleterious effects of natural elements and conditions surrounding military operations. For the purpose of this test method standard, the term “devices” includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This part of a multipart test method standard is intended to apply only to semiconductor devices.

Product Details

Published:

08/12/2016

Number of Pages:

177

File Size:

1 file , 1.5 MB

Note:

This product is unavailable in Ukraine, Russia, Belarus