IEC 62884-3 Ed. 1.0 b

IEC 62884-3 Ed. 1.0 b

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IEC 62884-3 Ed. 1.0 b

IEC 62884-3 Ed. 1.0 b

Original price was: $89.00.Current price is: $53.40.

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods

Published by Publication Date Number of Pages
IEC 03/22/2018 26
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Description

IEC 62884-3 Ed. 1.0 b – Measurement techniques of piezoelectric, dielectric and electrostatic oscillators – Part 3: Frequency aging test methods

IEC 62884-3:2018 describes the methods for the measurement and evaluation of frequency aging tests of piezoelectric, dielectric and electrostatic oscillators, including Dielectric Resonator Oscillators (DRO) and oscillators using FBAR (hereinafter referred to as “Oscillator”). The purpose of those tests is to provide statistical data supporting aging predictions.
This document was developed from the works related to IEC 60679-1:2007 (third edition), the measurement techniques of which were restructured into different parts under a new project reference. This document describes the measurement method for frequency aging only.

Product Details

Edition:
1.0
Published:
03/22/2018
Number of Pages:
26
File Size:
1 file , 1.1 MB
Note:
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