IEC 62506 Ed. 1.0 b

IEC 62506 Ed. 1.0 b

Original price was: $417.00.Current price is: $250.20.

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IEC 62506 Ed. 1.0 b

Original price was: $417.00.Current price is: $250.20.

Methods for product accelerated testing

Published by Publication Date Number of Pages
IEC 06/18/2013 184
Digital PDFMulti-User AccessPrintable

Description

IEC 62506 Ed. 1.0 b – Methods for product accelerated testing

IEC 62506:2013 provides guidance on the application of various accelerated test techniques for measurement or improvement of product reliability. Identification of potential failure modes that could be experienced in the use of a product/item and their mitigation is instrumental to ensure dependability of an item. The object of the methods is to either identify potential design weakness or provide information on item dependability, or to achieve necessary reliability/availability improvement, all within a compressed or accelerated period of time. This standard addresses accelerated testing of non-repairable and repairable systems. It can be used for probability ratio sequential tests, fixed duration tests and reliability improvement/growth tests, where the measure of reliability may differ from the standard probability of failure occurrence. This standard also extends to present accelerated testing or production screening methods that would identify weakness introduced into the product by manufacturing error, which could compromise product dependability. Keywords: test techniques for measurement or improvement of product reliability

Product Details

Edition:
1.0
Published:
06/18/2013
Number of Pages:
184
File Size:
1 file , 1.7 MB
Note:
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