DIN
Showing 6901–6915 of 13147 results
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Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell
Published by Publication Date Number of Pages DIN 08/01/1987 2 DIN 50450-1
Original price was: $34.87.$20.93Current price is: $20.93. -
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-40%Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N<(Index)2>, Ar, He, Ne and H<(Index)2> by using a galvanic cell
Published by Publication Date Number of Pages DIN 03/01/1991 2 DIN 50450-2
Original price was: $34.87.$20.93Current price is: $20.93. -
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-40%Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of methane impurity in H<(Index)2>, O<(Index)2>, N<(Index)2>, Ar and He by using a flame ionization detector (FID)
Published by Publication Date Number of Pages DIN 03/01/1991 2 DIN 50450-3
Original price was: $33.92.$20.35Current price is: $20.35. -
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-40%Testing of materials for semiconductor technology; determination of impurities in carrier gases and dopant gases; determination of C<(Index)1>-C<(Index)3>-hydrocarbons in nitrogen by gas-chromatography
Published by Publication Date Number of Pages DIN 09/01/1993 2 DIN 50450-4
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-40%Testing of materials for semiconductor technology - Determination of impurities in carrier gases and dopant gases - Part 9: Determination of oxygen, nitrogen, carbonmonoxide, carbondioxide, hydrogen and C<(Index)1>-C<(Index)3>-hydrocarbons in gaseous hydrogen chloride by gaschromatography
Published by Publication Date Number of Pages DIN 07/01/2021 8 DIN 50450-9
Original price was: $40.39.$24.24Current price is: $24.24. -
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Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS
Published by Publication Date Number of Pages DIN 04/01/2003 4 DIN 50451-1
Original price was: $51.73.$31.04Current price is: $31.04. -
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Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2: Calcium (Ca), cobalt (Co), chromium (Cr), copper (Cu), Iron (Fe), nickel (Ni) and zinc (Zn) in hydrofluoric acid with plasma-induced emission spectroscopy
Published by Publication Date Number of Pages DIN 04/01/2003 4 DIN 50451-2
Original price was: $51.73.$31.04Current price is: $31.04. -
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-40%Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 3: Determination of 31 elements in high-purity nitric acid by ICP-MS
Published by Publication Date Number of Pages DIN 11/01/2014 19 DIN 50451-3
Original price was: $76.43.$45.86Current price is: $45.86. -
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-40%Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 4: Determination of 34 elements in ultra pure water by mass spectrometry with inductively coupled plasma (ICP-MS)
Published by Publication Date Number of Pages DIN 02/01/2007 13 DIN 50451-4
Original price was: $62.54.$37.52Current price is: $37.52. -
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-40%Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range of micrograms per
Published by Publication Date Number of Pages DIN 03/01/2010 11 DIN 50451-5
Original price was: $55.54.$33.32Current price is: $33.32. -
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-40%Draft Document - Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 5: Guideline for the selection of materials and testing of their suitability for apparatus for sampling and sample preparation for the determination of trace elements in the range o
Published by Publication Date Number of Pages DIN 02/01/2022 11 DIN 50451-5 – DRAFT
Original price was: $55.44.$33.26Current price is: $33.26. -
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-40%Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 6: Determination of 36 elements in a high-purity ammonium fluoride solution (NH<(Index)4>F) and in etching mixtures of high-purity ammonium fluoride solution containing hydrofluoric acid
Published by Publication Date Number of Pages DIN 11/01/2014 14 DIN 50451-6
Original price was: $62.54.$37.52Current price is: $37.52. -
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-40%Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 7: Determination of 31 elements in high-purity hydrochloric acid by ICP-MS
Published by Publication Date Number of Pages DIN 04/01/2018 14 DIN 50451-7
Original price was: $65.40.$39.24Current price is: $39.24. -
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-40%Draft Document - Testing of materials for semiconductor technology - Determination of traces of elements in liquids - Part 8: Determination of 33 elements in high-purity sulfuric acid by ICP-MS
Published by Publication Date Number of Pages DIN 01/01/2022 12 DIN 50451-8 – DRAFT
Original price was: $55.44.$33.26Current price is: $33.26.
