Category
Recently Viewed Products
-
JEDEC J-STD-048
$51.00$30.60 -
JEDEC JEP 79
$67.00$40.20 -
CIE 053
$143.10$85.86 -
IES RP-40
$90.00$54.00 -
ESD SP27.1
$169.00$101.40
ESD JS-002 – ANSI/ESDA/JEDEC Joint Standard for Electrostatic Discharge Sensitivity Testing, Charged Device Model (CDM) – Device Level
This document establishes the procedure for testing, evaluating, and classifying devices and microcircuits according to their susceptibility (sensitivity) to damage or degradation by exposure to a defined field-induced charged device model (CDM) electrostatic discharge (ESD). All packaged semiconductor devices, thin-film circuits, surface acoustic wave (SAW) devices, optoelectronic devices, hybrid integrated circuits (HICs), and multi-chip modules (MCMs) containing any of these devices are to be evaluated according to this standard. The devices shall be assembled into a package similar to that expected in the final application to perform the tests. This CDM document does not apply to socketed discharge model testers.
Product Details
- Published:
- 07/26/2022
- ISBN(s):
- 1585373338
- ANSI:
- ANSI Approved
- Number of Pages:
- 52
- File Size:
- 1 file , 1.2 MB
- Note:
- This product is unavailable in Russia, Ukraine, Belarus
Related products
-
ESD TR23.0-01
$22.00$13.20Add to cartFor the Protection of EOS/ESD Susceptible Items – Electrical Overstress in Manufacturing and Test
Published by Publication Date Number of Pages ESD 2020 38 -
ESD TR5.5-01
$10.00$6.00Add to cartTransmission Line Pulse (TLP)
Published by Publication Date Number of Pages ESD 10/01/2008 39 -
ESD TR50.0-02
$10.00$6.00Add to cartHigh Resistance Ohmmeters – Voltage Measurements
Published by Publication Date Number of Pages ESD 1999 8 -
ESD TR5.5-04
$22.00$13.20Add to cartTransmission Line Pulse (TLP) – User and Application Guide
Published by Publication Date Number of Pages ESD 08/15/2022 62