Description

SAE J2052 – Test Device Head Contact Duration Analysis (Stabilized: Jul 2016)

This methodology can be used for all calculations of HIC, with all test devices having an upper neck triaxial load cell mounted rigidly to the head, and head triaxial accelerometers.

Product Details

Published:

07/12/2016

File Size:

1 file , 170 KB

Note:

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