IEC 62374 Ed. 1.0 b

IEC 62374 Ed. 1.0 b

Original price was: $183.00.Current price is: $109.80.

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IEC 62374 Ed. 1.0 b

IEC 62374 Ed. 1.0 b

Original price was: $183.00.Current price is: $109.80.

Semiconductor devices – Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Published by Publication Date Number of Pages
IEC 03/29/2007 43
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Description

IEC 62374 Ed. 1.0 b – Semiconductor devices – Time dependent dielectric breakdown (TDDB) test for gate dielectric films

Provides a test method of Time Dependent Dielectric Breakdown (TDDB) for gate dielectric films on semiconductor devices and a product lifetime estimation method of TDDB failure

Product Details

Edition:
1.0
Published:
03/29/2007
Number of Pages:
43
File Size:
1 file , 720 KB
Note:
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